Silicon Dioxide Side Effects

Silicon dioxide E551, also known as silica (from the Latin silex), is a chemical compound that is an oxide of silicon with the chemical formula SiO2.  Though Silicon dioxide E551 is considered safe, some are convinced it has potentially dangerous health effects.

What Is Silicon Dioxide E551?

Silicon Dioxide E551 is an oxide of silicon with the chemical formula SiO2. This product is a common additive in the production of foods, where it is used primarily as a flow agent in powdered foods, or to absorb water in hygroscopic applications. It is often used in cheese, fat spreads, confectionery, dried vegetables, etc.

Possible Side Effects of Silicon Dioxide E551

Although Silicon Dioxide E551 generally regarded as a very safe and effective supplement, there can be some minor side effects. The side effects may:

  • Kidney stones can occur, though rarely, in people taking silicon-containing antacids for long periods of time.

GRAS Affirmation: Yes

Generally recognized as safe (GRAS) is an American Food and Drug Administration (FDA) designation that a chemical or substance added to food is considered safe by experts, and so is exempted from the usual Federal Food, Drug, and Cosmetic Act (FFDCA) food additive tolerance requirements. Silicon Dioxide is considered safe.

Suggested Dosage


Special Populations Precaution

There is a lot of concern about diet and nutrition for these population, like Newborns, children, pregnant, sensitive to Silicon Dioxide populations. Better consult to your doctor if you would like to intake Silicon Dioxide.




Related Research

1. Oxidative potential of ultraviolet-A irradiated or nonirradiated suspensions of titanium dioxide or silicon dioxide nanoparticles on Allium cepa roots. [Environ Toxicol Chem. 2014 Apr] Author: Koce JD, Drobne D, Klančnik K, Makovec D, Novak S, Hočevar M.

2. Acute toxicity of intravenously administered microfabricated silicon dioxide drug delivery particles in mice: preliminary findings. [Drugs R D. 2005] Author: Martin FJ, Melnik K, West T, Shapiro J, Cohen M, Boiarski AA, Ferrari M.